Equipment / Capabilities

TRANSMISSION ELECTRON MICROSCOPE (TEM)

FEI TECNAI SPIRIT G2 with ICORR

FEI’s iCorr™ technology consists of a fluorescence light  microscope module and unique software that researchers use to conduct fast and accurate correlative microscopy experiments with transmission electron microscopy (TEM). Researchers quickly pinpoint structures of interest on their sample using the fluorescence light microscopy mode and then navigate easily to these features in TEM mode. Then, they are able to automatically capture high resolution image data on the stored structures using the electron microscopy mode.

iCorr’s powerful software automatically correlates the results. This combination of technology and automation streamlines experiments, allowing users to quickly capture data from two modalities without ever changing instruments. This integrated approach removes the challenges with conducting correlative microscopy experiments and opens up new dimensions for biological research.

The microscope is equipped with the FEI Eagle 4k digital camera. The bottom-mounted camera has a very large dynamic range, a high resolution and is optimized for high sensitivity.

T12

JEOL JEM-1400Flash TEM

The JEM-1400Flash is used in a wide range of fields, such as biology, nanotechnology, polymer, and advanced materials. In the observation of biological specimens including macro-molecular materials, medicines, pathological sections and viruses, usually the entire view of tissues, structures, target locations and observation area are first confirmed at low magnification, and then fine structures of interest are carefully studied at high magnification. To smoothly proceed to this series of observation, recent demands for easier observation steps to acquire higher-throughput image data are increasing. 

The JEM-1400Flash is equipped with a high-sensitivity sCMOS camera, “Matataki Flash”, JEOL’s innovative high-sensitivity sCMOS camera that dramatically reduces the readout noise while possessing high frame rate. This powerful feature enables high-throughput acquisition of sharp TEM images with extremely low-noise.

1400Flash

JEOL JEM -1220 TEM

The JEM-1010 TEM and JEM-1220 TEM operates at 100kV with a tungsten electron source. It is a compact high performance TEM with advanced features and functions. The high contrast objective lens polepiece combines the highest possible contrast and brightness with optimum resolution for life science studies. The JEOL cool beam gun allows high-brightness, high coherence illumination conditions with low emission current. They have user-friendly controls that are suitable for beginners in TEM imaging.

SCANNING ELECTRON MICROSCOPES (SEM)

FEI QUANTA 650 FEG SEM

The FEI Quanta 650 FEG SEM allows characterization of conductive and non-conductive samples with SE and BSE imaging possible in every mode of operation. It minimizes the amount of sample preparation, and the low vacuum capability enables charge-free imaging of non-conductive specimens thanks to Quanta’s patented through-the-lens pumping.

Surface imaging with optional beam deceleration mode is possible to obtain surface and compositional information from conductive samples. Easy to use and intuitive controls makes highly effective operation possible for novice users.

FEI QUANTA 650 FEG SEM

JEOL JSM-6701F FEG SEM

The JSM-6701F with the high resolution semi in-lens enables one to observe delicate specimens with minimum damage at very low accelerating voltages. At lower voltages, the fine surface structures can be observed more clearly than at higher voltages. Non-conductive specimens can be observed without a conductive coating on the specimens.

6701

SAMPLE PREPARATION FOR MICROSCOPY

Ultramicrotomes
REICHERT ULTRACUT E
LEICA ULTRACUT UCT
LEICA EM UC6
LEICA EM UC7

Automated immunogold labelling system
LEICA EM IGL

Critical point dryers and sputter coaters
LEICA EM CPD300
LEICA EM ACE200

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